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ID: 8368.0, PIK / PIK Publications
Krey, V.; Guo, F.; Kolp, P.; Zhou, W.; Schaeffer, R.; Awasthy, A.; Bertram, C.; Sytze de Boer, H.; Fragkos, P.; Fujimori, S.; He, C.; Iyer, G.; Keramidas, K.; Köberle, A. C.; Oshiro, K.; Reis, L. A.; Shoai-Tehrani, B.; Vishwanathan, S.; Capros, P.; Drouet, L.; Edmonds, J. E.; Garg, A.; Gernaat, D. E. H. J.; Jiang, K.; Kannavou, M.; Kitous, A.; Kriegler, E.; Luderer, G.; Mathur, R.; Muratori, M.; Sano, F.; Vuuren, D. P. van
Looking under the hood: A comparison of techno-economic assumptions across national and global integrated assessment models
In: Energy, 172
2019. 1254-1267 p.
10.1016/j.energy.2018.12.131
Doctype: Article (ISI journal)
8368oa.pdf (3.53 Mb)
version 2.00b13/16
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