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ID: 8723.0, PIK / PIK Publications
Zhang, S.; Bauer, N.; Yin, G.; Xie, X.
Technology learning and diffusion at the global and local scales: A modeling exercise in the REMIND model
In: Technological Forecasting and Social Change, 151 , Art. 119765
2020.
10.1016/j.techfore.2019.119765
Doctype: Article (ISI journal)
Accepted by:  pikadmin (23.12.2019 10:54)
version 2.00b13/16
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