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ID: 1603.0, PIK / PIK Publications
Schaaf, C.; Strahler, A.; Gao, F.; Lucht, W.; Li, X.; Muller, J.-P.; Lewis, P.; Barnsley, M.; Liang, S.
MODIS operational bidirectional reflectance, albedo and nadir reflectance products
International geoscience remote sensing symposium 01
Sydney, Australia : 
2001.
Doctype: Conference paper
Departments: Global Change & Natural Systems
Accepted by:  root (21.09.2004 16:12)
version 2.00b13/16
PP&B