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ID: 7734.0, PIK / PIK Publications , full text not public
Fronzek, S.; Pirttioja, N.; Carter, T. R.; Bindi, M.; Hoffmann, H.; Palosuo, T.; Ruiz-Ramos, M.; Tao, F.; Trnka, M.; Acutis, M.; Asseng, S.; Baranowski, P.; Basso, B.; Bodin, P.; Buis, S.; Cammarano, D.; Deligios, P.; Destain, M-F.; Dumont, B.; Ewert, F.; Ferrise, R.; François, L.; Gaiser, T.; Hlavinka, P.; Jacquemin, I.; Kersebaum, K. C.; Kollas, C.; Krzyszczak, J.; Lorite, I. M.; Minet, J.; Minguez, M. I.; Montesino, M.; Moriondo, M.; Müller, C.; Nendel, C.; Öztürk, I.; Perego, A.; Rodríguez, A.; Ruane, A. C.; Ruget, F.; Sanna, M.; Semenov, M. A.; Slawinski, C.; Stratonovitch, P.; Supit, I.; Waha, K.; Wang, E.; Wu, L.; Zhao, Z.; Rötter, R. P.
Classifying multi-model wheat yield impact response surfaces showing sensitivity to temperature and precipitation change
In: Agricultural Systems
2017 (Online first).
10.1016/j.agsy.2017.08.004
Doctype: Article (ISI journal)
Accepted by:  pikadmin (31.08.2017 13:10)
version 2.00b13/16
PP&B